News
HTT Group's SPECIAL CUSTOMIZED PROBECARDS
Htt Probecard Division has built any probe card for a wafer scale solution with a needle count up to 460 in two rows and 4 levels.
The special feature is the linear expansion over 13 cm.
Basic premise for a perfect measurement is a good cooperation between the needle spider and the Board with the corresponding stiffener.
For more detailled information about our broad range of customized probecards please click here
Watch EMV Show's video
Have a look on this official EMV 2014 show video showing our business partner Bill O'Brian (Thermo Fisher) giving some statements about the show!
For more product Infos about Thermo Fisher Scientific ESD products please click here
Pressure Test Probe Card
The Pressure Test Probe Card allows to connect a MEMS DUT with Probe Needles at the same time the MEMS membrane oft he DUT is set under pressure up till 3 bar. The deflection of the membrane can be watched throught the clear pressure foot surface.
htt Probecard Division - ISO 9001:2008 certified for the 3rd year in a row
Mechatronic mBWR200 - Press Release @ imveurope
Click here to see the full press release regarding our Mechatronic mBWR200 Batch Wafer Reader.
htt proudly announces its new Service Manager Arne Holland.
For all matters regarding Service and CE issues please do not hesitate to contact Arne Holland, new htt Group Service - and CE Manager.
Rigaku sells first 450mm TXRF Tóol
Our partner Rigaku Corporation recently announced the sale of its first 450mm TXRF Total-Reflection X-Ray Fluorescence Spectrometer tool to a global Semiconductor Equipment Manufacturer.
Rigaku TXRF systems are widely used for contamination measurements on the front- and/or backside surface of semiconductor substrates like silicon or silicon-carbide.
Please feel free to read Rigaku’s press release dated Feb 13, 2014 on our website.
htt group will join Semicon China Show, March 18 - 20, 2014
Visit us onsite for life demonstrations of IOSS WID110 and Mechatronic mBWR200 Batch Wafer Reader at booth # 4535 in Hall N4.
For more information please click here
Johnstech releases new product 'IQtouch Micro' for Wafer Level Final Test
htt group will join EMV2014 Show from 11th to 13th of March, 2014
Visit htt together with Thermo Fisher Scientific at booth # CCD-024.
For more information please clicke here
Have a look at our new Wedge Probe Card Presentation
Wedge Probe Cards are available at htt Probecard Division
Watch our new mBWR200 Batch Wafer Reader Video
For more product information please click here
6th IS-Test Workshop, register here
6th IS-Test Workshop (ITWS)
- Call For Papers MEMS Probing & Probing @ The Limits May 12th & 13th, 2014
For more information please click here.
Watch our new IOSS WID110 Wafer ID Reader video
For more Product Information about IOSS WID110 Wafer ID Reader please click here
Visit htt group at Semicon Europe, 8. - 10th of September, 2013
Visit htt for LIFE DEMOS of IOSS WID110 Wafer ID Reader and Mechatronic mBWR200 Batch Wafer Reader.
The team of htt group is looking forward to your visit at our booth # 1728.
new Miniprobers available at htt Probe Card Division
For more information about our Miniprobers please click here
Look at our new ITS Chuck Cleaning Wafer Video!
