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Home | Semiconductor Production

Semiconductor Production


All product steps to make an integrated circuit, from forming a crystal to final test of an integrated circuit.


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MPI - Thermal
ThermalAir TA-1000A ThermalAir Desktop Series Temperature Forcing System
-25°C to +200°C
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Genesem
Trim Form Singulation System
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MPI - Thermal
ThermalAir TA-3000A ThermalAir Series Temperature Forcing System
-60°C to +225°C
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Tesec
471-TT Wafer Parallel Test System
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Tesec
MERCURY FREE - 431-TT Discrete Device Test System
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MPI - Thermal
Thermal Air TA-5000A-HT
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MPI - Probecards
Cantilever
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Cyberoptics Semiconductor
WaferSense® Auto Resistance Sensor™ (ARS)
Real time resistance measurement of plating cell contacts.
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Global Zeus Korea
ION12
300mm single wafer wet cleaning, etching equipment
Single Spin Solution
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Global Zeus Korea
APOLLON
300mm single wafer wet cleaning, etching, PR stripping equipment
Single Spin Solution
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MPI - Probecards
Vertical FCB
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MPI - Probecards
Vertical EVS
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MPI - Probecards
Vertical OSPREY
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MPI - Probecards
Vertical Grey Owl
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MPI - Probecards
Substrate
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Tesec
881-ＴＴ/Ａ Discrete Device Test System
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Tesec
391-TT 971-TT/B Discrete Device Test System
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TurboDynamics
Manipulator TD1280
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TurboDynamics
Conversion Kit
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TurboDynamics
Manipulator TD2080
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TurboDynamics
Probe Card Trolley
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TurboDynamics
Trolley TD1295
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TurboDynamics
Socket Quick Lock 702
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TurboDynamics
Storage Systems
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TurboDynamics
Stiffener Advantest V93k
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TurboDynamics
Stiffener - Clamp Shell Solution
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TurboDynamics
Stiffener - Probe Interface Board Locker
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MPI - Thermal
ThermalAir TA-5000A Precise Temperature Forcing System
-80°C to +225°C
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MPI - Thermal
ThermalAir TA 5000A with Hood
High capacity thermal air stream systems
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MPI - Thermal
ThermalAir TA-5000B with Flex Hose Precise Temperature Forcing System
-80°C to +225°C
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MPI - Thermal
ThermalAir TC-100 Air Chiller High capacity thermal air process chiller
-80°C
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MPI - Thermal
ThermalAir Accessories
Temperature Chambers & Thermal Test Enclosure
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AEHR Test Systems
FOX-NP Full Wafer & Singulated Die / Module Test System
Compact High Power Test and Reliability Verifications Solution for Logic / Memory / Photonic Devices
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AEHR Test Systems
FOX-CP Full Wafer Test System
Compact Test and Reliability Verification Solution for Logic/Memory/Photonic Devices
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AEHR Test Systems
FOX-XP Multi Wafer & Singulated Die / Module Test System
High Throughput Burn-in and Test Solution for Logic / Memory / Photonic Devices
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AEHR Test Systems
FOX XP WaferPak Aligner
Wafer Loader / Unloader for FOX WaferPak Contactors
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AEHR Test Systems
FOX-1P Full Wafer Test System
High Power Test and Reliability Verification Solution for Logic / Memory / Photonic Devices
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AEHR Test Systems
FOX - Die Pak Carrier
Singulated Die / Module Test & Burn-in
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AEHR Test Systems
DiePak Loader
Device Loader / Unloader for FOX DiePak Carriers
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AEHR Test Systems
ABTS
A high capacity system for test and burn-in of logic devices
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AEHR Test Systems
Burn-in-Boards
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AEHR Test Systems
Automated ABTS BIB Loader
Automated Burn-In Board (BIB) loading and unloading solution
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IOSS
WID120
The new benchmark in wafer ID reading
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IOSS
90° mirror
90° mirror for horizontal mounting of WID110 Wafer ID Reader
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IOSS
Darkfield Light Adapter
Mountable Darkfield Light Adapter for IOSS-WID110 Wafer ID Reader.
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IOSS
External illumination
External illumination for different light angles
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IOSS
DMG100
Data Matrix ECC200 reading and more
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IOSS
DMR220
2D Reading system
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