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Home | Semiconductor Production

Semiconductor Production


All product steps to make an integrated circuit, from forming a crystal to final test of an integrated circuit.


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MPI - Thermal
TA-1000A
ThermalAir Desktop Series Temperature Forcing System
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Genesem
Trim Form Singulation System
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MPI - Thermal
TA-3000A
An Evolution in Temperature Testing
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MPI - Thermal
TA-5000B with Clamshell Chamber & Flex Hose
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MPI - Probecards
Conventional Cantilever
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MPI - Probecards
Conventional Cobra
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MPI - Probecards
Gt-B MEMs
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MPI - Probecards
Gt-V MEMS
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MPI - Probecards
Gt-X MEMs
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MPI - Thermal
ThermalAir TA-5000A with glass cap
Flexible Temperature Testing & Thermal Cycling
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MPI - Thermal
ThermalAir TA 5000A with Clamshell & Flex Hose
High capacity thermal air stream systems
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MPI - Thermal
ThermalAir TA 5000A with Hood
High capacity thermal air stream systems
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MPI - Thermal
ThermalAir TA5000B Flex Hose
An evolution in localized Temperature Test Systems
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MPI - Thermal
TC-100 Gas Chiller
An Evolution in Localized Temperature Test Systems
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MPI - Thermal
Accessories
The ThermalAir TA-5000 series have a wide range of accessories
that are attached to the ThermalAir Stream Arm and Flex Hose
located at the end of Thermal Head output gas nozzles.
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AEHR Test Systems
FOX-NP Full Wafer & Singulated Die / Module Test System
Compact High Power Test and Reliability Verifications Solution for Logic / Memory / Photonic Devices
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AEHR Test Systems
FOX-CP Full Wafer Test System
Compact Test and Reliability Verification Solution for Logic/Memory/Photonic Devices
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AEHR Test Systems
FOX-XP Multi Wafer & Singulated Die / Module Test System
High Throughput Burn-in and Test Solution for Logic / Memory / Photonic Devices
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AEHR Test Systems
FOX XP WaferPak Aligner
Wafer Loader / Unloader for FOX WaferPak Contactors
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AEHR Test Systems
FOX-1P Full Wafer Test System
High Power Test and Reliability Verification Solution for Logic / Memory / Photonic Devices
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AEHR Test Systems
FOX - Die Pak Carrier
Singulated Die / Module Test & Burn-in
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AEHR Test Systems
DiePak Loader
Device Loader / Unloader for FOX DiePak Carriers
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AEHR Test Systems
ABTS
A high capacity system for test and burn-in of logic devices
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AEHR Test Systems
Burn-in-Boards
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AEHR Test Systems
Automated ABTS BIB Loader
Automated Burn-In Board (BIB) loading and unloading solution
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IOSS
WID120
The new benchmark in wafer ID reading
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IOSS
90° mirror
90° mirror for horizontal mounting of WID110 Wafer ID Reader
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IOSS
Darkfield Light Adapter
Mountable Darkfield Light Adapter for IOSS-WID110 Wafer ID Reader.
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IOSS
External illumination
External illumination for different light angles
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IOSS
DMG100
Data Matrix ECC200 reading and more
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IOSS
DMR220
2D Reading system
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IOSS
DMG110
2D Code Reader for extremely small codes on transparent or reflective surfaces
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IOSS
BCA110
Reticle Barcode Reader
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htt Group
VS5040 Handheld
Handheld Barcode Reader
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IOSS
WID110
Wafer ID Reader
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3S Korea
300mm FOUP
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3S Korea
300mm FOSB
Model V2
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3S Korea
300mm OPEN CASSETTE
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Mechatronic
mBWR200
Batch Wafer Reader
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QES Mechatronic Sdn. Bhd.
WID100R
Wafer Batch ID Reader System for 100mm Wafer
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QES Mechatronic Sdn. Bhd.
WID150R
Wafer Batch ID Reader System for 150mm Wafer
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QES Mechatronic Sdn. Bhd.
DHS8000
Automatic Barcode Printing and Labelling System
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QES Mechatronic Sdn. Bhd.
DIS8000
Post Dicing Inspection System
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QES Mechatronic Sdn. Bhd.
ISP3100
Post Wire Bond Inspection System
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QES Mechatronic Sdn. Bhd.
LSI1000
Strip Laser Marking Handler System
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QES Mechatronic Sdn. Bhd.
WHS300G
Wafer Batch Transfer System
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QES Mechatronic Sdn. Bhd.
WHS8000
Wafer Sorter System
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Cyberoptics Semiconductor
WaferSense® Auto Vibration and Leveling Sensor™ AVLS3
Speed simultaneous vibration and leveling measurements.
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