AEHR Test Systems - FOX-CP Full Wafer Test System
Compact Solution for High Throughput Reliability Verification and Test
Capable of testing thousands of die in a single touchdown
Identifies failing logic/memory/photonic die before final package integration
Integrated system with wafer handling and stepping capabilities
Full-wafer test system using a WaferPak™ contactor And wafer prober available with a high performance thermal chuck for high power wafer requirements
Configurable Channel Resources for Full-Wafer Test and Reliability Verification
Multiple resource modules are available: Universal Channel Modules, High Voltage Channel
Modules or High Current Channel Modules
Up to 2,048 “Universal Channel” resources: (I/O / Clock / PPMU / DPS) with deep scan, pattern data and capture memory per channel for test of devices with BIST/DFT
Up to 1,024 high voltage (29 V) or high current (2 A) Sources resources
Production Proven Full-Wafer Reliability Verification & Test Solution
Reduces test cost by functionally testing wafer during reliability verification
Compatible with industry standard probers and probe cards
Protects wafers and probe cards with per channel over-current and over-voltage protection
Capable of testing thousands of die in a single touchdown
Identifies failing logic/memory/photonic die before final package integration
Integrated system with wafer handling and stepping capabilities
Full-wafer test system using a WaferPak™ contactor And wafer prober available with a high performance thermal chuck for high power wafer requirements
Configurable Channel Resources for Full-Wafer Test and Reliability Verification
Multiple resource modules are available: Universal Channel Modules, High Voltage Channel
Modules or High Current Channel Modules
Up to 2,048 “Universal Channel” resources: (I/O / Clock / PPMU / DPS) with deep scan, pattern data and capture memory per channel for test of devices with BIST/DFT
Up to 1,024 high voltage (29 V) or high current (2 A) Sources resources
Production Proven Full-Wafer Reliability Verification & Test Solution
Reduces test cost by functionally testing wafer during reliability verification
Compatible with industry standard probers and probe cards
Protects wafers and probe cards with per channel over-current and over-voltage protection
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