AEHR Test Systems - FOX-1P Full Wafer Test System
Enables High Throughput, Single Touchdown, Full Wafer Production Testing
Capable of simultaneously testing up to 16,000 die in a single wafer touchdown
Resource configurable up to 16,384 “ Universal Channels ” – each programmable as an
I/O, Clock, Pin Parametric Measurement Unit (P PMU) or Device Power Supply ( DPS )
Software-enabled per site flexibility to support small and large device pin count test needs
Comprehensive functional and parametric test capabilities
Deep functional pattern data and capture memory optimized for BIST/DFT testing
Per channel PMU for per site parametric testing
Individual channel over-current protection to protect wafers and probe cards
Configured for high volume production
Compatible with industry standard probers and probe cards
Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F
Configurable as a single or dual system integrated test cell
Capable of simultaneously testing up to 16,000 die in a single wafer touchdown
Resource configurable up to 16,384 “ Universal Channels ” – each programmable as an
I/O, Clock, Pin Parametric Measurement Unit (P PMU) or Device Power Supply ( DPS )
Software-enabled per site flexibility to support small and large device pin count test needs
Comprehensive functional and parametric test capabilities
Deep functional pattern data and capture memory optimized for BIST/DFT testing
Per channel PMU for per site parametric testing
Individual channel over-current protection to protect wafers and probe cards
Configured for high volume production
Compatible with industry standard probers and probe cards
Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F
Configurable as a single or dual system integrated test cell
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