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Home | Semiconductor Production | Wafer Prober & Test | AEHR Test Systems - FOX - Die Pak Carrier

AEHR Test Systems - FOX - Die Pak Carrier


FOX - Die Pak Carrier
AEHR Test Systems

www.aehr.com
Delivers FOX-XP system resources to up to 1,024 singulated die / modules per DiePak carrier, enabling high density test and burn-in

Supports up to 2,048 I/O and DPS channels with remote voltage and ground sense per pin

DiePak sockets are custom designed per application by Aehr Test to ensure electrical performance and burn-in temperature stability

Optional optical measurement capability incorporated into each socket

Handles up to 2 kW of power dissipation per DiePak Carrier

Temperature range: Ambient to 150° C

Field repairable carrier

Download Datasheet
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