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Home | Semiconductor Production | Wafer Prober & Test | AEHR Test Systems - Burn-in-Boards

AEHR Test Systems - Burn-in-Boards


Burn-in-Boards
AEHR Test Systems

www.aehr.com
Boards used to hold and connect one or more Devices Under Test (DUTs) to the power and test resources of the ABTS system.

Very Economical BIB Format

Economical PC Fab Size

Multiple vendors around the world

Card-edge Connector Interface

No Connector Cost

Non-proprietary Interface

No License Fees

BIB sizes supported

Standard: 20.67” x 22.67” (525 mm x 576 mm)

Custom up to 24” square (610 mm square)

Direct Contact

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